Agilent 5989-2589EN English 2014-05-16 PDF 3.32 MB c20140728 [34] free download

File name 5989-2589EN English _ 2014-05-16 _ PDF 3.32 MB c20140728 [34].pdf

Keysight Technologies Basics of Measuring the Dielectric Properties of Materials Application Note Contents Introduction ...3 Dialetic Theory ...4 Dielectric constant ...4 Permeability ...7 Electromagnetic Propagation ...8 Dialectric mechanisms ...10 Orientation (dipolar) polarization ...11 Electronic and atomic polarization ...11 Relaxation time ...12 Debye relation ...12 Cole-Cole diagram ...13 Ionic conductivity ...13 Interfacial or space charge polarization ...14 Measurement systems ...15 Network analyzers ...15 Impedance analyzers and LCR meters ...16 Fixtures ...16 Software ...16 Measurement Techniques ...17 Coaxial probe ...17 Transmission line ...20 Free-space ...23 Resonant cavity ...26 Parallel plate ...29 Inductance measurement method ...30 Comparison of methods ...31 Keysight solutions ...32 References ...33 Web resources ...34 2 Introduction A wide variety of industries need a better understanding of the materials they are working with to shorten design cycles, improve incoming inspection